Design of Test Data Compressor/Decompressor Using Xmatchpro Method

Higher Circuit Densities in system-on-chip (SOC) designs have led to drastic increase in test data volume. Larger Test Data size demands not only higher memory requirements, but also an increase in testing time. Test Data Compression/Decompression addresses this problem by reducing the test data volume without affecting the overall system performance. This paper presented an algorithm, XMatchPro Algorithm that combines the advantages of dictionary-based and bit mask-based techniques. Our test compression technique used the dictionary and bit mask selection methods to significantly reduce the testing time and memory requirements. We have applied our algorithm on various benchmarks and compared our results with existing test compression/Decompression techniques. Our approach results compression efficiency of 92%. Our approach also generates up to 90% improvement in decompression efficiency compared to other techniques without introducing any additional performance or area overhead.